Night-Shift Failure Analysis Technician (SEM, FIB, EDX) in Newport

Night-Shift Failure Analysis Technician (SEM, FIB, EDX) in Newport

Newport Full-Time 30000 - 40000 £ / year (est.) No working from home possible
Vishay Intertechnology Inc.

At a Glance

  • Tasks: Conduct failure analysis using advanced equipment like SEM and EDX on night shifts.
  • Company: Join Vishay Intertechnology, a leader in tech innovation.
  • Benefits: Receive full training, competitive pay, and work in a supportive team.
  • Other info: Enjoy a dynamic night-shift role with opportunities for growth.
  • Why this job: Gain hands-on experience with cutting-edge technology and make a real difference.
  • Qualifications: No prior experience needed; just a passion for tech and learning.

The predicted salary is between 30000 - 40000 £ per year.

Vishay Intertechnology, Inc. in Newport (UK) invites applications for a Failure Analysis shift technician joining the FA team on back-end nights (12 hours, 7pm–7am; Wed, Thu, Fri and alternating Saturdays).

You will perform physical and structural analysis of wafers and samples using Optical microscope, SEM, FIB, Plasma etcher and EDX. Full training will be provided on dayshift (Mon-Fri).

You will contribute to:

  • SEM/FIB cross sections
  • EDX analysis
  • Wafer de-processing
  • Optical inspections

Night-Shift Failure Analysis Technician (SEM, FIB, EDX) in Newport employer: Vishay Intertechnology Inc.

Vishay Intertechnology Inc. is an exceptional employer located in Newport, UK, offering a dynamic work culture that fosters innovation and collaboration. Employees benefit from comprehensive growth opportunities within the semiconductor industry, particularly in cutting-edge technologies like wide-bandgap semiconductors. Join us to be part of a team that values quality and reliability while shaping the future of technology.

Vishay Intertechnology Inc.

Contact Details:

Vishay Intertechnology Inc. Recruitment Team

We think you need these skills to ace Night-Shift Failure Analysis Technician (SEM, FIB, EDX) in Newport

Optical Microscopy
Scanning Electron Microscopy (SEM)
Focused Ion Beam (FIB)
Energy Dispersive X-ray Spectroscopy (EDX)
Plasma Etching
Physical Analysis
Structural Analysis